Surface and Interface Engineering for Superconducting Quantum Circuits. The limiting factor for current quantum computers is a process called decoherence. This project aims to identify new strategies to reduce decoherence in quantum computer components using an interdisciplinary approach based on quantum physics, materials science, and engineering. This project involves investigating the effect of
atomically sharp interfaces on decoherence and using capping layers to control and/or inhibit oxide ....Surface and Interface Engineering for Superconducting Quantum Circuits. The limiting factor for current quantum computers is a process called decoherence. This project aims to identify new strategies to reduce decoherence in quantum computer components using an interdisciplinary approach based on quantum physics, materials science, and engineering. This project involves investigating the effect of
atomically sharp interfaces on decoherence and using capping layers to control and/or inhibit oxide growth that reduce the contribution of interfaces to decoherence. Expected outcomes of this project include development of solutions to fabricate long-lived superconducting qubits benefiting superconducting quantum technologies and making a significant step towards realisation of a practical quantum computer.Read moreRead less
Nonlinear Optical Metrology of Electronic Interfaces for Silicon Devices. This project aims to develop a prototype electric field induced second harmonic generation metrology setup for studying thin film dielectric interfaces on silicon in partnership with Femtometrix. The quality of these silicon-dielectric interfaces, which are affected by trapped charges and defects, are critical for microelectronic and optoelectronic device manufacturing. Through several proposed methodologies to separate th ....Nonlinear Optical Metrology of Electronic Interfaces for Silicon Devices. This project aims to develop a prototype electric field induced second harmonic generation metrology setup for studying thin film dielectric interfaces on silicon in partnership with Femtometrix. The quality of these silicon-dielectric interfaces, which are affected by trapped charges and defects, are critical for microelectronic and optoelectronic device manufacturing. Through several proposed methodologies to separate the effect of interface and bulk signals, it is expected that the sensitivity of the prototype setup will exceed the previous record of 1 kV/cm. This metrology technique will be further expanded for applicability to silicon photovoltaics, specifically passivating contacts which cannot be studied via conventional techniques.Read moreRead less
Unlocking the potential of quantitative x-ray micro-tomography. This project aims to build on two new ideas in data acquisition and 3D image reconstruction to bring 3D X-ray microscopy or computed tomography (CT) into advanced research use as well as common industrial applications. In the past 10 years, CT has improved our understanding in areas ranging from the evolution of life and osteoporosis to composite material failure and oil recovery. However, the full potential of CT remains unrealised ....Unlocking the potential of quantitative x-ray micro-tomography. This project aims to build on two new ideas in data acquisition and 3D image reconstruction to bring 3D X-ray microscopy or computed tomography (CT) into advanced research use as well as common industrial applications. In the past 10 years, CT has improved our understanding in areas ranging from the evolution of life and osteoporosis to composite material failure and oil recovery. However, the full potential of CT remains unrealised because crucial features in structure and composition are overlooked by simplistic algorithms. Users cannot directly capture quantities of interest such as key compositional variation or defects, and workflows are poorly adapted for large-scale use in industrial fabrication or phenomics. This project aims to address these shortcomings using advanced mathematics and algorithms.Read moreRead less
Advanced X-ray investigation of atomic and condensed matter science for Australian industry and scientific research. This project aims to improve the precision and calibration of measurements involving X-rays. This in turn will improve outcomes and instrumentation which utilise X-ray sources to probe structures and properties of advanced materials and biological samples.